集成串转并数字电路的C波段GaAs双通道幅相多功能芯片

C-band GaAs dual-channel amplitude and phase multifunctional chip integrated with digital serial to parallel converter

  • 摘要:基于0.15-μm GaAs增强型赝配高电子迁移率晶体管(E-mode pHEMT)工艺,研制了一款5.8~6.8 GHz的C波段双通道幅相多功能芯片。该芯片集成了7位数控衰减器、增益补偿低噪声放大器、6位数控移相器、功分器和30位串转并等电路。集成的串转并数字电路用于对两个通道的衰减移相进行控制和识别芯片地址。测试结果表明,参考态时,2个通道的增益为0~0.5 dB和−0.15~0.42 dB,测量噪声均小于6.38 dB;衰减态时,通道1和通道2的衰减均方根(RMS)误差小于0.35 dB和0.34 dB,对应的附加调相RMS误差小于2.5°和2.45°;移相态时,通道1和通道2的移相RMS误差小于2.27°和2.36°,对应的寄生调幅RMS误差均小于0.27 dB。该多功能芯片具有衰减位数多、衰减移相精度高、衰减附加调相和移相寄生调幅小、集成度高的特点。

    Abstract:A 5.8 GHz to 6.8 GHz C-band dual-channel amplitude and phase multifunctional chip was developed based on 0.15-μm GaAs enhancement-mode pseudomorphic high electron mobility transistor (E-mode pHEMT) process. The chip integrates 7-bit digitally controlled attenuator, gain compensation low noise amplifier, 6-bit digitally controlled phase shifter, power divider, and 30-bit digital serial-to-parallel converter. The integrated serial-to-parallel converter can control the attenuation and phase shift, and is also applied for recognition of chip address. The measured results show that in the reference state, the gains of the two channels are 0 dB to −0.5 dB and −0.15 dB to 0.42 dB, and their measured noises are less than 6.38 dB. In the attenuation state, the attenuation root mean square (RMS) errors of channel 1 and channel 2 are less than 0.35 dB and 0.34 dB, and the associated parasitic phase RMS errors are less than 2.5°and 2.45°, respectively. In the phase shift state, the phase RMS errors of channel 1 and channel 2 are less than 2.27° and 2.36°, and the corresponding parasitic amplitude RMS errors are lower than 0.27 dB. The presented chip exhibits the characteristics of large attenuation bit, high accuracy of attenuation and phase shift, small parasitic amplitude RMS error and parasitic phase RMS error, and a high integration level.

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